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Testing for climatic influence resistance In February 2009 the certification testing of GSM modem MC35iT COM Industrial DIN, was carried out including the high and low temperature and high humidity resistance testing. High temperature resistance testing The testing was carried out at temperatures: high operating temperature +55°С and higher limit temperature +85°С.
The testing time was 30 minutes at set temperature +55°С, three products were tested. The KTH-20 testing chamber has input hole for cable connection, which allows performing testing without taking the product out. For testing three products simultaneously the program module “LabTest.exe” was designed. During the testing the products demonstrated stable operation – responding to the AT-commands, the network registration is stable, receiving and transmission of data is correct. Also the influence of high temperature did not effect the visual appearance of the products.
During the testing the product was placed inside the chamber and kept there for 40 minutes at the set temperature +85°С. After that the temperature was reduced down to +25°С and the testing was performed using program module “LabTest.exe”. After the implementation of high temperature the tested products have demonstrated stable operation – AT-commands are responded, the network registration is stable, the data receiving and transmission are correct. Also the implementation of higher limit temperature does not effect the visual appearance of the products. Low temperature implementation testing. The testing was performed at the temperatures: low operation temperature -20°С and low limit temperature -40°С.
The testing was performed after the temperature in the chamber reached -20°С and the devices were held there for 40 minutes. Total three devices were tested. The program module “LabTest.exe” was used for functionality testing. The testing results have shown the stable operation of the devices - AT-commands are responded, the network registration is stable, the data receiving and transmission are correct. Also the implementation of low temperature does not effect the visual appearance of the products.
After the exposure to the lower limit temperature the tested devices have demonstrated stable functionality - AT-commands are responded, the network registration is stable, the data receiving and transmission are correct. Also the implementation of lower limit temperature does not effect the visual appearance of the products. High humidity implementation testing The testing was performed in accordance with theState Standard Specification P 51368-99method 207-2 – temporary mode (without moisture condensation). The testing was applied to three devices simultaneously in chamber KTV-80, which has a slot for cable input. This allows for the testing without removing the device from the chamber. Program module “LabTest.exe” was used for the testing of three devices simultaneously. The testing was performed in the following order: the devices were placed in the humidity chamber; the temperature was increased up to 55°С; and the devices were held in the chamber for 1 hour. Then the humidity in the chamber was increased up to 93%. The devices were held in the chamber in such conditions for 6 days. The functionality testing was performed every half an hour. Please see the video:Wlaga_01.avi (1.20 MB) , Wlaga_02.avi (316.00 KB) The testing results have shown the stable operation of the devices - AT-commands are responded, the network registration is stable, the data receiving and transmission are correct. Also the implementation of high humidity does not effect the visual appearance of the products. There are no corrosion and surface damage detected. |
The influence of high operating temperature was testing with accordance to 
The influence of higher limit temperature was measured according to the State Standard Specification P 51368-99, method 202-1 – the testing of influence of higher temperature limit while transporting and storage.
The influence of low operating temperature was measured according to the State Standard Specification P 51368-99, method 203-1 – the testing of influence of low ambient temperature value in operating mode. The given method implies the measurement of product parameters after the implementation of low value of operating temperature (“cold” start-up).
The influence of lower limit operating temperature was measured according to the State Standard Specification P 51368-99, method 204-1 – the testing of influence of low limit ambient temperature while storing and transporting. The products were placed in the chamber and kept there for 40 minutes at the set temperature -40°С. After the exposure, the temperature was increased up to +25°С and the devices were tested according to the “LabTest.exe” program module.